TITLE: MPMS-3 Improving Accuracy & Material characterizaction - From bulk to the nanoscale and beyond+
AUTHOR: Randy K. Dumas, Senior Application Scientist, Quantum Design, Inc.
INVITED BY: José Luis Martínez, Eva Céspedes, Esther Calle
WHEN: June, 26 from 10AM to 12PM
WHERE: Salón de Actos, ICMM-CSIC. C/ Sor Juana Inés de la Cruz, 3 - Madrid
ABSTRACT: This talk will first briefly describe the differences between the DC-Scan and SQUID-VSM measurement modes. While it may at first seem redundant to have two techniques that measure the same fundamental property, i.e. the DC magnetic moment, each detection mode has its own unique benefits depending on the sample and sample mounting constraints. The talk will then transition into considerations and techniques one can employ to improve measurement accuracy and get the most out of the MPMS3. More specifically, topics will include:
- Sample mounting tips and tricks
- Dealing with magnet remanence
- How to account for varying sample sizes and shapes
- Background subtraction
The second part of the talk will provide a historical overview of the diverse materials characterization techniques offered by Quantum Design. While Quantum Design’s first commercial measurement platform, the Magnetic Property Measurement System (MPMS®), was developed for high-sensitivity magnetic measurements, the capability to also measure the electric transport properties was soon added. This was of principal importance for researchers who needed to correlate the behaviour of the magnetic moment and electrical resistance of novel superconducting samples. The more general Physical Property Measurement System (PPMS®) further expanded the experimental toolset to also include thermal (e.g., thermal conductivity and heat capacity) measurements over an even wider range of environmental (i.e., temperature and magnetic field) conditions. More recently, platforms such as OptiCool® have not only enabled various optical measurements, but also microscopy and the ability to probe material properties at the nanoscale. With the advent of FusionScope®, Quantum Design’s nearly 45-year history of facilitating easy-to use equipment for correlative measurements, now includes a platform specifically designed for correlative microscopy. FusionScope combines the complementary strengths of atomic force microscopy (AFM), scanning electron microscopy (SEM), and elemental analysis via energy dispersive X-ray spectroscopy (EDS). When combined, the family of instruments offered by Quantum Design facilitate materials characterization that not only spans a wide range of environmental parameters, but also length scales. More specifically, FusionScope bridges the gap between the typically bulk characterizations carried out by the MPMS and PPMS platforms and the surface/nanoscale characterization that is often required for a thorough and complete analysis.
