Riquelme Ballesta, Juan José

Dr Juan J Riquelme studies new materials characterising their magnetic properties in the normal and in the superconductor state with the help of Scanning Probe Microscopy techniques.

Part of his contributions in the field of the techniques related to low-temperature Scanning Probe Microscopy (AFM & STM) may be regarded as advanced. Namely, he has analysed the interplay between the mechanical properties and electronic transport properties of nanocontacts in the normal and in the superconducting state. Besides, he has designed tailored Atomic Force Microscopy tools for applications such as patterning of substrates in UHV.

Currently, his efforts are directed to performing experimental work on new materials using Magnetic Force Microscopy at Low Temperature and in High Magnetic fields.