Organization
Support Laboratories

ICMM-CSIC

Scanning Probe Microscopy

 

Scientific Director

Agustina Asenjo

 

Equipment

AFM-MFM system from Nanotec Electronica. The system works under different conditions: ambient conditions, gases, controlled humidity, HV (high vacuum) and under magnetic fields.

 

Description

The Scanning Probe Microscopy Service of the ICMM-CSIC was established as an internal an external service to provide additional surface characterization in a broad range of research areas. These techniques are mainly used to characterize:

  • Topographic properties (three-dimensional surface imaging, surface roughness, grain size, step height).
  • Magnetic properties (domain and domain wall configuration)
  • Electrical properties (Conductive Scanning Probe Microscopy and Kelvin Probe Microscopy).

 

Restrictions 

Samples up to 30 µm in diameter.

Maximum scan size: 60 µm

 

Tariffs

Tariff A- Users ICMM

Tariff B - OPIs, Public Universities and IMDEA

Tariff C - Enterprises

Tariff D - Other Institutes of CSIC

 

Concept Tariff A Tariff B Tariff C Tariff D
AFM ambient conditions (session 4 h) 120,00 125,00 140,00 125,00
MFM ambient conditions (session 4 h) 200,00 220,00 240,00 220,00
VF-MFM (session 4 h)
Data processing and technical report 80,00 85,00 95,00 85,00
Selfservice (session 4 h) 80,00
0,00 0,00 0,00 0,00
AFM Probes 20,00 20,00 20,00 20,00
MFM Probes Budget Sensors 25,00 25,00 25,00 25,00
MFM Probes Nanosensors 80,00 80,00 80,00 80,00


 

 

Application form   LIMS




   

ICMM-2020 - Sor Juana Inés de la Cruz, 3, Cantoblanco, 28049 Madrid, Spain. Tel: +34 91 334 9000. info@icmm.csic.es