Scientific Director
Agustina Asenjo
Equipment
AFM-MFM system from Nanotec Electronica. The system works under different conditions: ambient conditions, gases, controlled humidity, HV (high vacuum) and under magnetic fields.
Description
The Scanning Probe Microscopy Service of the ICMM-CSIC was established as an internal an external service to provide additional surface characterization in a broad range of research areas. These techniques are mainly used to characterize:
Restrictions
Samples up to 30 µm in diameter.
Maximum scan size: 60 µm
Tariff A- Users ICMM
Tariff B - OPIs, Public Universities and IMDEA
Tariff C - Enterprises
Tariff D - Other Institutes of CSIC
| Concept | Tariff A | Tariff B | Tariff C | Tariff D |
| AFM ambient conditions (session 4 h) | 120,00 | 125,00 | 140,00 | 125,00 |
| MFM ambient conditions (session 4 h) | 200,00 | 220,00 | 240,00 | 220,00 |
| VF-MFM (session 4 h) | ||||
| Data processing and technical report | 80,00 | 85,00 | 95,00 | 85,00 |
| Selfservice (session 4 h) | 80,00 | |||
| 0,00 | 0,00 | 0,00 | 0,00 | |
| AFM Probes | 20,00 | 20,00 | 20,00 | 20,00 |
| MFM Probes Budget Sensors | 25,00 | 25,00 | 25,00 | 25,00 |
| MFM Probes Nanosensors | 80,00 | 80,00 | 80,00 | 80,00 |
Application form 
