Organization
Support Laboratories

Scanning Probe Microscopy

Scientific Director

Agustina Asenjo

Equipment

AFM-MFM system from Nanotec Electronica. The system works under different conditions: ambient conditions, gases, controlled humidity, HV (high vacuum) and under magnetic fields.

Description

The Scanning Probe Microscopy Service of the ICMM-CSIC was established as an internal an external service to provide additional surface characterization in a broad range of research areas. These techniques are mainly used to characterize:

• Topographic properties (three-dimensional surface imaging, surface roughness, grain size, step height).
• Magnetic properties (domain and domain wall configuration)
• Electrical properties (Conductive Scanning Probe Microscopy and Kelvin Probe Microscopy).

Restrictions 

Samples up to 30 µm in diameter.

Maximum scan size: 60 µm

Tariffs

Tariff A- Users ICMM

Tariff B - OPIs, Public Universities and IMDEA

Tariff C - Enterprises

Tariff D - Other Institutes of CSIC

Application form