Scanning Probe Microscopy

The Scanning Probe Microscopy Service of the ICMM-CSIC was recently established as an internal an external service to provide additional surface characterization in a broad range of research activities. The SPM Service facilities are an AFM-MFM system from Nanotec Electronica and a new HV-MFM. The AFM-MFM system is mainly use to characterize different surface properties:

• Topographic properties (three-dimensional surface imaging, surface roughness, grain size, step heigh).
• Magnetic properties operating in MFM mode (domain distribution in thin films and nanostructures and local magnetization reversal processes)
• Electrical properties (Conductive Scanning Probe Microscopy and Kelvin Probe Microscopy).
• Mechanical properties (nanoindentation and adhesion maps).