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Seminars of the Research Lines
Nanostructures, Surfaces and Coatings
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14 May 2013, 12:00 h. Sala de Seminarios, 182
Challenges for nanomechanical sensors in biological detection
Monserrat Calleja
Instituto de Microelectronica de Madrid (IMM-CSIC) |
Nanomechanical biosensing relies on changes in the movement and deformation of micro- and nanoscale objects when they interact with biomolecules and other biological targets. This field of
research has provided ever-increasing records in the sensitivity of label-free detection but it has not yet been established as a practical alternative for biological detection. In this seminar, I will present the latest advancements in the field, along with the challenges remaining for nanomechanical biosensors to become a commonly used tool in biology and biochemistry laboratories.
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28 February 2013, 10:00 h. Sala de Seminarios, 182
Imaging the nano on the macro
Oliver Payton
University of Bristol, Bristol, UK |
The atomic force microscope (AFM) can image a diverse range of conducting and non-conducting samples in vacuum, air and liquid environments, making it one of the most popular tools for observing, characterising and anipulating structures on the nanoscale. However, AFM typically requires at least a minute to collect a single frame which: a) prevents it from resolving the majority of biological processes and b) renders it impractical for scanning mm2 or cm2 areas.
Research at the University of Bristol has increased the frame rate of the atomic force microscope (AFM) from one frame taking over a minute to build, to achieving video rate nano-scale imaging using high-speed contact mode AFM (HSAFM). Recent research into the cantilever dynamics have led to a dramatic increase in image quality. By using the high pixel rate and automatically panning the scanning window around a surface, it is possible to build up AFM images with nanometre pixel pitch over an area in excess of 1x1 cm. The total pixel count of such images can be close to a terapixel. With minor adjustments the HSAFM apparatus is capable of mapping material properties such as the local surface sti ness simultaneously with the surface topography. Using a conductive cantilever it is also possible to carry out nanolithography on silicon surfaces. This talk will give an overview of the development of the apparatus and examples of some of the surfaces we have characterised. |
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