MICROSCOPY

Please, click on the technique to download the specifications datasheet if available. Also, click on the contact person if you require additional information.

TECHNIQUEINFORMATION REVEALEDCONTACT PERSONADDITIONAL COMMENTS
SCANNING ELECTRON MICROSCOPY (SEM)

External size and morphology (texture); Chemical Composition; Crystalline structure and orientation. Lateral resolution ≈ 5 nm

Access by research platform (service)


Richard Clergereaux (LAPLACE, CNRS)

Ex-situ technique. Large amount of samples can be analyzed. Imaging available in scanning mode

TRANSMISSION ELECTRON MICROSCOPY (TEM)

Internal composition and morphology; crystallization, stress and magnetic domains. Lateral resolution ≈ 1 Å

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Richard Clergereaux (LAPLACE, CNRS)

Ex-situ technique. Much higher resolution than SEM. Analysis of small amount of samples. FIB milling to analyze the internal structure of large nanoparticles

ATOMIC FORCE MICROSCOPY (AFM)

Measure local properties with a tip typically topography but also others like surface potential in both conductors and insulators. Suits well in liquid gas environments and UHV combined with STM. Lateral resolution ≈ 10 nm (in air)

Lidia Martínez (ICMM-Surfaces, CSIC) - in air
Javier Méndez (ICMM-Surfaces, CSIC) - controlled environment

Ex-situ technique. Vertical resolution down to 1 nm. Possibility of make in-situ for special samples

SCANNING TUNNELING MICROSCOPY (STM)

Measure local properties using quantum tunneling. Applicable to conductors. Lateral resolution ≈ 0,1 Å

Javier Méndez (ICMM-Surfaces, CSIC)

In-situ technique. Suitable for Vacuum Transfer System (VTS)

Allows imaging at the so-called diffraction limit. Applied to the study of multicomponent polymeric systems in nanotechnology apart from many applications in biology, medicine, etc.

Access by beamtime application

Study of structural and
chemical modifications in the polymer film around
micro-perforations, orientation of polymer molecules, crystalline
morphology of semi-crystalline polymers …