Organization

ICMM-CSIC

Techniques Equipment

 

  Compositional and Structural Analysis

 

Chemical Analysis Lab

  • Adiabatic Calorimetry under Applied Magnetic Field
  • Atomic Absorption
  • Elemental Analysis C, N, H, S
  • Gas Chromatography (GC-MS, GC-FTIR)
  • LKB Adsorption Microcalorimetry
  • Mass Spectrometry
  • Plasma Emision Spectrometry (ICP)

Nanostructures, Surfaces, Coatings, and Molecular Astrophysics Research Line

  • Image Analysis
  • Low Energy Electron Diffraction (LEED)
  • Microscopies:
  • Spectroscopies:
    • AES, ELD, UPS, ESD
    • Angle-resolved Photoelectron (ARXPS, ARUPS)
    • Glow Discharge Optical Emission
    • Secondary Electron Emission (SEY)
    • X-ray Photoelectron Spectroscopy (XPS) with lateral resolution

New Architectures in Materials Chemistry

  • Field Emission Scanning Electron Microscope (FE-SEM)

Nuclear Magnetic Resonance (NMR) Lab

  • Nuclear Magnetic Resonance (NMR)
    • 400 MHz NMR Spectrometer (MAS)
    • 100 MHz NMR Spectromete

Specific Surface Area and Porosity Analysis Lab

  • Sorptometer (Specific Surface Area / Porosity)

Thermal Analysis Lab

  • Thermal Analysis
    • DTA/TG
    • DTA/TG/MS
    • DSC

X-Ray Diffraction Lab

  • X-Ray Diffractometers:
    • Powder
      • Grazing Incident X-Ray Diffractometer (GIXRD)
      • with a High-Temperature chamber
    • Single Crystal
    • Texture
    • X-Ray Diffraction Chambers (Guinier, Precesion and Weissenberg)
  • Electric and Magnetic Characterization

Materials for Information Technologies Research Line

  • AC Susceptometer
  • Electrochemical Impedance Equipment
  • Ferro-pyro-piezoelectric Characterization
  • Magnetometers:
    • Conventional Vibrant sample
    • Vibrant sample (with low and high Temperatrue chambers)
  • Magnetotransport
  • Measurement and Control of Magnetic Fields
  • SQUID (Superconducting Quantum Interference Device)
  • Thermomagnetic Measurements

Scanning Probe Microscopy Lab

  • Atomic Force Microscope (AFM), Magnetic Force Microscopy (MFM) and VF-MFM
  • Optical Characterization

IR Spectrophotometer Lab

  • Absorption Spectrophotometers: UV, VIS, NIR, IR

Materials for Information Technologies Research Line

  • Brillouin Spectroscopy
  • Dynamic Holography
  • Ellipsometry
  • Interferometry
  • Photoluminescence: UV-VIS-NIR
  • Raman
  • Sample Preparation

Nanostructures, Surfaces, Coatings and Molecular Astrophysics Research Line

  • Chemical and Physical Vapor Deposition of thin films (PVD y CVD)
  • Laser UV Ablation Growth
  • Magnetron Sputtering
  • Molecular Beam Epitaxy of Metals (MBE metals)
  • Molecular Beam Epitaxy of Semiconductors (MBE semiconductors)

Photonic Materials Research Line

  • Single Crystal Growth (Czochralski Method)

 


       

ICMM-2017 - Sor Juana Inés de la Cruz, 3, Cantoblanco, 28049 Madrid, Spain. Tel: +34 91 334 9000. Fax: +34 91 372 0623. info@icmm.csic.es